BrikoX@lemmy.zipM to Hardware@programming.devEnglish · 2 months agoChinese scientists discover method to cut defects by 99% with DUV chipmaking equipment, but it destroys EUV pattern fidelity — analyzing photoresist clustering with cryo-ET at 105°Cwww.tomshardware.comexternal-linkmessage-square0linkfedilinkarrow-up11arrow-down10file-text
arrow-up11arrow-down1external-linkChinese scientists discover method to cut defects by 99% with DUV chipmaking equipment, but it destroys EUV pattern fidelity — analyzing photoresist clustering with cryo-ET at 105°Cwww.tomshardware.comBrikoX@lemmy.zipM to Hardware@programming.devEnglish · 2 months agomessage-square0linkfedilinkfile-text